Understanding Variation and Statistical Process Control: Process Variation and Statistical Process Control (SPC)

By NACK Network

Center for Nanotechnology Education and Utilization, Pennsylvania State University, State College, PA

Published on

Abstract

Outline

  • Normal and Special Cause Variation.
  • Specification Limits vs Control Limits.
  • Calculations for the Individuals Chart.
  • Nelson Rules to determine out-of-control signals (special cause variation) from process data.
  • Calculations for the X bar & R Chart.
  • Advantages of subgroup data collection.

Sponsored by

The Nanotechnology Applications and Career Knowledge (NACK) Network

Funded, in part, by a grant from the National Science Foundation. DUE 1205105

Cite this work

Researchers should cite this work as follows:

  • NACK Network (2017), "Understanding Variation and Statistical Process Control: Process Variation and Statistical Process Control (SPC)," http://nanohub.org/resources/27735.

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