Fundamentals of Metrology and Characterization for Nanotechnology

By Diane Hickey-Davis

Published on

Abstract

Outline:

  • How do we see what we can’t see?
  • Five common nanotech instruments
  • For each, I’ll cover:
    • What it does
    • How it works
    • Where it’s used in Industry
    • What subjects you can teach with it
    • What skills your students can learn from it

Cite this work

Researchers should cite this work as follows:

  • Diane Hickey-Davis (2019), "Fundamentals of Metrology and Characterization for Nanotechnology," http://nanohub.org/resources/30128.

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Submitter

NACK Network

Center for Nanotechnology Education and Utilization, Pennsylvania State University, State College, PA