Manufacturing at the Nanoscale: Challenges and Opportunities

By Placid M. Ferreira1; Jay R Roloff2

1. Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 2. University of Illinois at Urbana-Champaign

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Bio

Placid M. Ferreira Placid M. Ferreira is the Tungchao Julia Lu Professor of Mechanical Science and Engineering at Illinois. From 2003 to 2009, he was the director of the Center for Chemical-Electrical-Mechanical Manufacturing Systems (Nano-CEMMS), an NSF-sponsored Nanoscale Science and Engineering Center after which he served as the Head of the Department of Mechanical Science and Engineering at Illinois until August 2015.  He graduated with a PhD in Industrial Engineering from Purdue University in 1987, M.Tech (Mechanical) from IIT Bombay, 1982 and B.E. (Mechanical) for University of Bombay in 1980. He has been on the mechanical engineering faculty at Illinois since 1987, serving as the Associate Head for graduate programs and research from 1999 to 2002. From 2009 to 2015 he served as Department Head for Mechanical Science and Engineering.

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Researchers should cite this work as follows:

  • Placid M. Ferreira, Jay R Roloff (2019), "Manufacturing at the Nanoscale: Challenges and Opportunities," https://nanohub.org/resources/30182.

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Location

NCSA Room 1040, University of Illinois at Urbana-Champaign, Urbana, IL

Tags

Manufacturing at the Nanoscale: Challenges and Opportunities
  • Manufacturing @ Nano- & Micro-Dimensional Scales 1. Manufacturing @ Nano- & Micro-… 0
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  • Motivation 2. Motivation 28.795462128795464
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  • In the rear view mirror….. 3. In the rear view mirror….. 250.95095095095095
    00:00/00:00
  • In the rear view mirror….. 4. In the rear view mirror….. 364.89823156489825
    00:00/00:00
  • Work-ability and Integration of Ordered Carbon Nanotubes 5. Work-ability and Integration o… 457.52419085752422
    00:00/00:00
  • Process Technology 6. Process Technology 504.53787120453791
    00:00/00:00
  • New Process Technologies 7. New Process Technologies 599.33266599933268
    00:00/00:00
  • E xamples of Secondary & Tertiary Processes 8. E xamples of Secondary & Terti… 676.10944277610952
    00:00/00:00
  • Ionic/Electrochemical Nano-pattering 9. Ionic/Electrochemical Nano-pat… 794.86152819486153
    00:00/00:00
  • Ag and Cu Nanostructures 10. Ag and Cu Nanostructures 796.89689689689692
    00:00/00:00
  • Ionic/electrochemical processes 11. Ionic/electrochemical processe… 867.26726726726724
    00:00/00:00
  • Solid State Superionic Stamping(S4) 12. Solid State Superionic Stampin… 894.72806139472812
    00:00/00:00
  • S4 Advantages & Challenges Advantages 13. S4 Advantages & Challenges Adv… 948.8822155488823
    00:00/00:00
  • Solid State Superionic Stamping(S4) 14. Solid State Superionic Stampin… 958.19152485819154
    00:00/00:00
  • Superionic Stamping 15. Superionic Stamping 988.68868868868867
    00:00/00:00
  • Current Generation S4 Toolbit 16. Current Generation S4 Toolbit 1013.3800467133801
    00:00/00:00
  • S4 Rate, Resolution & Repeatability 17. S4 Rate, Resolution & Repeatab… 1037.9379379379379
    00:00/00:00
  • S4 Applications 18. S4 Applications 1039.3727060393728
    00:00/00:00
  • Current Research 19. Current Research 1058.7253920587255
    00:00/00:00
  • Solid-state Ionic Nano-manufacturing 20. Solid-state Ionic Nano-manufac… 1134.6346346346347
    00:00/00:00
  • Direct-Writing of Metallic Structures with Electron-Beams 21. Direct-Writing of Metallic Str… 1135.9025692359026
    00:00/00:00
  • Summary 22. Summary 1140.3403403403404
    00:00/00:00
  • Challenges in Nano Manufacturing 23. Challenges in Nano Manufacturi… 1175.6756756756756
    00:00/00:00
  • MEMS-Scale Parallel Kinematic Machines 24. MEMS-Scale Parallel Kinematic … 1313.0797464130799
    00:00/00:00
  • Towards MEMS-Scale Arrays 25. Towards MEMS-Scale Arrays 1315.5155155155155
    00:00/00:00
  • XYZ Positioning Platform 26. XYZ Positioning Platform 1338.2716049382716
    00:00/00:00
  • Calibration and Control 27. Calibration and Control 1343.6102769436104
    00:00/00:00
  • Position Calibration 28. Position Calibration 1347.6142809476144
    00:00/00:00
  • Application: Array-based TPL 29. Application: Array-based TPL 1374.5412078745412
    00:00/00:00
  • Integration and Assembly 30. Integration and Assembly 1378.712045378712
    00:00/00:00
  • Heterogeneous Functional Integration 31. Heterogeneous Functional Integ… 1393.1264597931265
    00:00/00:00
  • Heterogeneous Integration 32. Heterogeneous Integration 1506.6733400066735
    00:00/00:00
  • Micro-transfer Printing 33. Micro-transfer Printing 1545.679012345679
    00:00/00:00
  • Examples of µTP-enabled HFI 34. Examples of µTP-enabled HFI 1600.2335669002337
    00:00/00:00
  • Active Layered Composites & Stamps 35. Active Layered Composites & St… 1616.6499833166502
    00:00/00:00
  • Fabricated Active Composite Stamps 36. Fabricated Active Composite St… 1657.4908241574908
    00:00/00:00
  • Active Composite Stamps Active Composite Membrane Stamps – Position Control 37. Active Composite Stamps Active… 1676.60994327661
    00:00/00:00
  • Active Composite Stamps Active Composite Membrane Stamps – Position Control 38. Active Composite Stamps Active… 1687.1538204871538
    00:00/00:00
  • Forward-Looking Opportunities… 39. Forward-Looking Opportunitiesâ… 1688.355021688355
    00:00/00:00
  • Hierarchical Computational Tools for Nanomanufacturing 40. Hierarchical Computational Too… 1757.0570570570571
    00:00/00:00
  • Computational Stack 41. Computational Stack 1810.6106106106106
    00:00/00:00
  • nanoMFG node 42. nanoMFG node 1905.7390724057391
    00:00/00:00
  • EXAMPLE TOOLS 43. EXAMPLE TOOLS 1937.9045712379048
    00:00/00:00
  • ACTIVITIES TO-DATE 44. ACTIVITIES TO-DATE 1964.864864864865
    00:00/00:00
  • CYBERMANUFACTURING INFRASTRUCTURE 45. CYBERMANUFACTURING INFRASTRUCT… 2019.2192192192192
    00:00/00:00
  • Summary 46. Summary 2028.9622956289625
    00:00/00:00