MSE 582 Transmission Electron Microscopy Skills
Recommendations
- MSE 582 Lecture 1: Introduction
- MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources
- MSE 582 Lecture 3: Lenses, Apertures and Resolution
- MSE 582 Lecture 4: The Instrument, Part 1
- MSE 582 Lecture 4: The Instrument, Part 2
- MSE 582 Lecture 1: Introduction
- MSE 582 Lecture 8: Electron Scattering
- MSE 582 Lecture 12: Analytical Electron Microscopy
- MSE 582 Lecture 9: Diffraction
- What Can the TEM Tell You About Your Nanomaterial?
- Interviewing Skills
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Abstract
Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all students who use the TEM in their research.
Course Goals:
The course goal is for the students to become comptent, research-level transmission electron microscopists. They will understand the functions of the TEM and how it works. They will be competent in basic operating techniques, and ready to learn more advanced ones as needed.
Course Content:
- Instrumental design
- Electron properties & sources
- Lenses & Lens aberrations
- Image recording system
- Operation of the TEM
- Alignment & Calibration
- Diffraction
- Bright field imaging
- Dark field imaging
- Many-beam (high resolution) imaging
- Introduction to analysis of results - Diffraction
- Diffraction spot patterns
- Kikuchi patterns
- Convergent beam patterns
- Introduction to analysis of results - Images
- Two-beam images
- Many beam images
- Use of diffractograms
References
Primary textbook:
D.B. Williams and C.B. Carter, Transmission Electron Microscopy - A Textbook for Materials Science (4-Vol Set), Plenum Press, New York, ISBN: : 030645324X (paperback). Volume 1 strongly suggested.
Cite this work
Researchers should cite this work as follows:
-
Eric Stach (2008), "MSE 582 Transmission Electron Microscopy Skills," https://nanohub.org/resources/3777.