Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all students who use the TEM in their research.
The course goal is for the students to become comptent, research-level transmission electron microscopists. They will understand the functions of the TEM and how it works. They will be competent in basic operating techniques, and ready to learn more advanced ones as needed.
- Instrumental design
- Electron properties & sources
- Lenses & Lens aberrations
- Image recording system
- Operation of the TEM
- Alignment & Calibration
- Bright field imaging
- Dark field imaging
- Many-beam (high resolution) imaging
- Introduction to analysis of results - Diffraction
- Diffraction spot patterns
- Kikuchi patterns
- Convergent beam patterns
- Introduction to analysis of results - Images
- Two-beam images
- Many beam images
- Use of diffractograms
Primary textbook: D.B. Williams and C.B. Carter, Transmission Electron Microscopy - A Textbook for Materials Science (4-Vol Set), Plenum Press, New York, ISBN: : 030645324X (paperback). Volume 1 strongly suggested.
Cite this work
Researchers should cite this work as follows:
- electron microscopy
- materials science