This tool version is unpublished and cannot be run. If you would like to have this version staged, you can put a request through HUB Support.
Carrier Statistics Lab
Calculate the electron & hole density in semiconductors
Launch Tool
Archive Version 1.02
Published on 04 Mar 2009, unpublished on 10 Jun 2009 All versions
doi:10.4231/D3901ZF73 cite this
This tool is closed source.
Category
Published on
Abstract
The tool is supported by a homework assignment in which Students are asked to explore the differences between Fermi-Dirac and Maxwell-Boltzmann distributions, compute electron and hole concentrations, study temperature dependences, and study freeze-out.
Bug Fixes- Corrected the display of certain outputs.
- Updated the Front pane of the tool with correct figures of the distributions.
Credits
The tool is supported by a homework assignment in which Students are asked to explore the differences between Fermi-Dirac and Maxwell-Boltzmann distributions, compute electron and hole concentrations, study temperature dependences, and study freeze-out.
Sponsored by
NCN@Purdue
References
Semiconductor Device Fundamentals , Robert Pierret Physics of Semiconductor Devices, S M Sze
Cite this work
Researchers should cite this work as follows: