Carrier Statistics Lab

Calculate the electron & hole density in semiconductors

Launch Tool

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Archive Version 1.2
Published on 17 Jul 2009, unpublished on 17 Jul 2009 All versions

doi:10.4231/D3X34MR5S cite this



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This is a simple tool that demonstrates electron and hole density distributions based on the Fermi-Dirac and Maxwell Boltzmann equations. This tool shows the dependence of carrier density, densisty of states and occupation factor on temperature and fermi level. User can choose between doped and undoped semi-conductors. Silicon, Germanium, and GaAs can be studied as a function of doping or Fermi level, and temperature. Homework: The tool is supported by a homework assignment in which Students are asked to explore the differences between Fermi-Dirac and Maxwell-Boltzmann distributions, compute electron and hole concentrations, study temperature dependences, and study freeze-out. First Time User Guide: This document provides important information about the tool, underlying physics and some assignment problems to help the user to get acquainted with the tool. Bug Fixes:
  • Corrected the display of certain outputs.
Recent upgrades with subsequent versions:
  • 1.2: Fixed for a bug in calculation of carrier densities.Computed values match analytical results for default input.
  • 1.1: Corrected ni value for Si at 300K. Plots made more resolved in energy axis.
  • 1.03: Updated the Front pane of the tool with correct figures of the distributions.
WishList: Detailed information about the wishlist for the tool is here .

Sponsored by



  • Semiconductor Device Fundamentals , Robert Pierret
  • Physics of Semiconductor Devices, S M Sze

Cite this work

Researchers should cite this work as follows:

  • Abhijeet Paul; Saumitra Raj Mehrotra; Gerhard Klimeck (2014), "Carrier Statistics Lab," (DOI: 10.4231/D3X34MR5S).

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