MSE 582 Lecture 4: The Instrument, Part 1

By Eric Stach

Materials Engineering, Purdue University, West Lafayette, IN

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Researchers should cite this work as follows:

  • Eric Stach (2008), "MSE 582 Lecture 4: The Instrument, Part 1," http://nanohub.org/resources/3907.

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Armstrong 3115, Purdue University, West Lafayette, IN

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MSE 582 Lecture 4: The Instrument, Part 1
  • Lecture 4: 1. Lecture 4: "The instrument" I 0
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  • Review of imaging modes 2. Review of imaging modes 40.14014014014014
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  • TEM overview 3. TEM overview 113.94728061394729
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  • TEM cross section 4. TEM cross section 216.68335001668336
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  • TEM cross section (simplified - somewhat) 5. TEM cross section (simplified … 326.8601935268602
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  • TEM cross section 6. TEM cross section 359.15915915915917
    00:00/00:00
  • Condenser system 7. Condenser system 726.69336002669343
    00:00/00:00
  • Condenser system 8. Condenser system "parallel bea… 895.42876209542885
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  • Condenser system effect of C1 strength - 9. Condenser system effect of C1 … 1243.0430430430431
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  • Condenser system effect of C1 strength - 10. Condenser system effect of C1 … 1274.240907574241
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  • Condenser system parallel illumination (Köhler) 11. Condenser system parallel illu… 1367.3673673673675
    00:00/00:00
  • Condenser system aperture effect 12. Condenser system aperture effe… 1437.303970637304
    00:00/00:00
  • Condenser system focused probe 13. Condenser system focused probe 1493.8605271938607
    00:00/00:00
  • Condenser system 'convergent beam' focused probe 14. Condenser system 'convergent b… 1521.2212212212212
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  • Condenser system scanning / tilting & translating 15. Condenser system scanning / ti… 1681.7484150817486
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  • Condenser system 16. Condenser system 1780.4471137804471
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  • Objective & Imaging system 17. Objective & Imaging system 1841.8752085418753
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  • Eucentric position 18. Eucentric position 1893.626960293627
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  • Recall … 19. Recall … 2013.8805472138806
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  • TEM imaging 20. TEM imaging 2566.1995328661997
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  • TEM imaging 21. TEM imaging 2594.5945945945946
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  • TEM diffraction 22. TEM diffraction 2617.2172172172172
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  • TEM diffraction 23. TEM diffraction 2623.4234234234236
    00:00/00:00
  • Selected area diffraction aperture 24. Selected area diffraction aper… 2676.0093426760095
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  • Bright field image 25. Bright field image 2681.8485151818486
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  • 26. "Dirty" dark field 2709.80980980981
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