MSE 582 Lecture 7: Sample Preperation

By Eric Stach

Materials Engineering, Purdue University, West Lafayette, IN

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Researchers should cite this work as follows:

  • Eric Stach (2008), "MSE 582 Lecture 7: Sample Preperation," http://nanohub.org/resources/3998.

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Armstrong 3115, Purdue University, West Lafayette, IN

Tags

  1. electron microscopy
  2. materials science
  3. TEM
MSE 582 Lecture 7: Sample Preperation
  • Lecture 7: Sample preparation 1. Lecture 7: Sample preparation 0
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  • Outline 2. Outline 162.39572906239573
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  • Safety 3. Safety 215.41541541541542
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  • Sample preparation 4. Sample preparation 696.262929596263
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  • Preparation from the bulk self-supporting discs of brittle materials 5. Preparation from the bulk self… 852.41908575241916
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  • Preparation from the bulk Cross sections of thin films on substrates 6. Preparation from the bulk Cros… 1082.1154487821154
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  • Preparation from the bulk Cross sections of thin films on substrates 7. Preparation from the bulk Cros… 1167.967967967968
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  • Sample preparation argon ion milling 8. Sample preparation argon ion m… 1210.2769436102769
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  • Sample preparation Electropolishing / Electrochemical 9. Sample preparation Electropoli… 1705.3053053053054
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  • Sample preparation other techniques / terms 10. Sample preparation other techn… 1961.6282949616284
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  • Focused ion beam microscopy 11. Focused ion beam microscopy 2220.3536870203538
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  • Focused ion beam 12. Focused ion beam "H bar" metho… 2407.8411745078411
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  • Focused ion beam site specific prep 13. Focused ion beam site specific… 2490.7907907907911
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  • Focused ion beam site specific prep 14. Focused ion beam site specific… 2531.8651985318652
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  • Focused ion beam site specific prep 15. Focused ion beam site specific… 2568.2349015682348
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  • Surface features 16. Surface features 2587.7877877877877
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  • Surface features 17. Surface features 2618.2515849182519
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  • Surface features 18. Surface features 2643.9773106439775
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  • Surface features 19. Surface features 2646.68001334668
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