MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

By Eric Stach

Brookhaven National Laboratory

View Presentation

Additional materials available (6)

Licensed under General Performance Usage.

Published on

Cite this work

Researchers should cite this work as follows:

  • Eric Stach (2008), "MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM," https://nanohub.org/resources/4018.

    BibTex | EndNote

Time

Location

Armstrong 3115, Purdue University, West Lafayette, IN

Tags