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MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

By Eric Stach

Purdue University

View Presentation (SWF)

Category Online Presentations
Cite this work

Researchers should cite this work as follows:

  • Eric Stach (2008), "MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM," http://nanohub.org/resources/4018.
Time 12:30 PM, February 06, 2008
Location Armstrong 3115, Purdue University, West Lafayette, IN
Tags
  1. course lecture 1
  2. electron microscopy 1

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