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MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

By Eric Stach

Purdue University

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Abstract  
Cite this work

Researchers should cite this work as follows:

  • Eric Stach (2008), "MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM," http://nanohub.org/resources/4018.

    BibTex | EndNote

Time 12:30 PM, February 06, 2008
Location Armstrong 3115, Purdue University, West Lafayette, IN
Tags
  1. from outside NCN
  2. from Purdue
  3. hosted/taped by NCN@Purdue

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