MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

By Eric Stach

Brookhaven National Laboratory

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Researchers should cite this work as follows:

  • Eric Stach (2008), "MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM," http://nanohub.org/resources/4018.

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Armstrong 3115, Purdue University, West Lafayette, IN

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