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Scanning Probe Microscope Operation

By John C. Bean

University of Virginia, Charlottesville, VA

Category Animations
Abstract

Scanning Probe Microscopes (SPMs) include Atomic Force Microscopes (AFMs) and Scanning Tunneling Microscopes (STMs or STEMs). They are the only instruments in widespread use that can actually "see" single atoms! You can skim this resource quickly to learn the general concepts of SPMs, or you can read carefully and almost be ready to operate one!

Credits

John Bean, University of Virginia
Virtual Science Lab

Cite this work

Researchers should cite this work as follows:

  • John C. Bean (2005), "Scanning Probe Microscope Operation," http://nanohub.org/resources/442.

    BibTex | EndNote

Tags
  1. experiments
  2. instruments
  3. K-12
  4. material science
  5. scanning probe microscopy

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