Modeling Coulomb Effects in Nanoscale Devices
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We describe the development of the modeling efforts focused towards proper description of the threshold voltage fluctuations due to the discrete impurity effects (different number and different distribution of the impurities from device to device on the same chip).
Researchers should cite this work as follows:
; ; (2008), "Modeling Coulomb Effects in Nanoscale Devices ," https://nanohub.org/resources/4437.