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Modeling Coulomb Effects in Nanoscale Devices

By Dragica Vasileska1, Shaikh S. Ahmed2, David K. Ferry1

1. Arizona State University 2. Southern Illinois University Carbondale

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Abstract

We describe the development of the modeling efforts focused towards proper description of the threshold voltage fluctuations due to the discrete impurity effects (different number and different distribution of the impurities from device to device on the same chip).

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Researchers should cite this work as follows:

  • Dragica Vasileska; Shaikh S. Ahmed; David K. Ferry (2008), "Modeling Coulomb Effects in Nanoscale Devices ," http://nanohub.org/resources/4437.

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