This resource describes a scanning electron microscope (SEM). It includes detailed depictions of how the electron beam is focused and used to create hugely magnified images of experimental specimens.

John Bean, University of Virginia
Virtual Science Lab

Researchers should cite this work as follows:

• John C. Bean (2005), "Scanning Electron Microscope," http://nanohub.org/resources/446.

  BibTex | EndNote

1. experiments
2. instruments
3. K-12
4. material science