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By Gerhard Klimeck1, Akira Matsudaira2, Shaikh S. Ahmed3, Dragica Vasileska4, Saumitra Raj Mehrotra1, Xufeng Wang1
1. Purdue University 2. University of Illinois at Urbana-Champaign 3. Southern Illinois University Carbondale 4. Arizona State University
Capacitance of a MOS device
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Version 1.7 - published on 22 Apr 2010
doi:10.4231/D3TM72116 cite this
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