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Micro-Mechanics Simulation Tool: Thin film

This tool simulates a threading dislocation evolving in a passivated thin film

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Archive Version 1.0.2
Published on 19 Oct 2009
Latest version: 1.1. All versions

doi:10.4231/D3FF3M01Q cite this

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Crystalline films grown epitaxially on substrates consisting of a different crystalline material are of considerable interest in optoelectronic devices and the semiconductor industry. The film and substrate have in general different lattice parameters. This lattice mismatch affects the quality of interfaces and can lead to very high densities of misfit dislocations. Here we study the strengthening of a thin film on a substrate. In particular we consider the motion of a dislocations gliding on its slip plane within the film and their interaction with the substrate.

Tags, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.