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Home › Groups › M. Ashraful Alam Research Group › Resources › Online Presentations › Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices › Reviews
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Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices

By Ahmad Ehteshamul Islam1, Souvik Mahapatra, Muhammad A. Alam2

1. Air Force Research Laboratory 2. Purdue University

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