Exercise: CV curves for MOS capacitors
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| Category | Teaching Materials |
|---|---|
| Abstract | This exercise demonstrates to the students how the low-frequency CV curves in MOS capacitors change with changing the gate workfunction, the oxide thickness and the dielectric constant. It also demonstrates the doping variation of the high-frequency CV curves. |
| Credits | NSF |
| Sponsored by | NSF |
| Cite this work | Researchers should cite this work as follows: |
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