Schred: Exercise 3
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| Category | Teaching Materials |
|---|---|
| Abstract | This exercise examines the degradation of the total gate capacitance with technology generation due to Maxwell-Boltzmann instead of Fermi-Dirac statistics, quantum-mechanical charge description and depletion of the polysilicon gates. |
| Sponsored by | NSF |
| Cite this work | Researchers should cite this work as follows: www.eas.asu.edu/~vasilesk
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