This exercise examines the degradation of the total gate capacitance with technology generation due to Maxwell-Boltzmann instead of Fermi-Dirac statistics, quantum-mechanical charge description and depletion of the polysilicon gates.

Researchers should cite this work as follows:

• Dragica Vasileska; Gerhard Klimeck (2008), "Schred: Exercise 3," https://nanohub.org/resources/4904.

1. ABACUS
2. ACUTE
3. Capacitance degradation
4. MOS capacitors
5. nanoelectronics