Schred: Exercise 3

By Dragica Vasileska1, Gerhard Klimeck2

1. Arizona State University 2. Purdue University

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Abstract

This exercise examines the degradation of the total gate capacitance with technology generation due to Maxwell-Boltzmann instead of Fermi-Dirac statistics, quantum-mechanical charge description and depletion of the polysilicon gates.

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Cite this work

Researchers should cite this work as follows:

  • www.eas.asu.edu/~vasilesk
  • Dragica Vasileska; Gerhard Klimeck (2008), "Schred: Exercise 3," http://nanohub.org/resources/4904.

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