Schred: Exercise 3

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This exercise examines the degradation of the total gate capacitance with technology generation due to Maxwell-Boltzmann instead of Fermi-Dirac statistics, quantum-mechanical charge description and depletion of the polysilicon gates.

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Researchers should cite this work as follows:

  • Dragica Vasileska; Gerhard Klimeck (2008), "Schred: Exercise 3,"

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