This tutorial will provide an overview of scanning probe microscopy (SPM) and its application towards problems in molecular conduction. In an effort to communicate the power and limitations of these instruments, the tutorial will describe design considerations and reveal the detailed construction of a cryogenic variable temperature ultra-high vacuum scanning tunneling microscope. With the microscope complete, the tutorial will then discuss its use for a variety of techniques that have been used to study the properties and performance of molecular-scale electronic devices. Specific examples include Kelvin probe microscopy, conductive atomic force microscope potentiometry, scanning tunneling spectroscopy, and inelastic electron tunneling spectroscopy.
Researchers should cite this work as follows:
(2004), "Probing Molecular Conduction with Scanning Probe Microscopy," http://nanohub.org/resources/497.
Northwestern University, Evanston, IL