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Atomic Force Microscopy

By Arvind Raman

Purdue University

Published on

Abstract

Atomic Force Microscopy is has become an indispensible tool in nanoscience for the fabrication, metrology, manipulation and property characterization of nanostructures. In this tutorial, we will review the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the oscillating tip, and the basic theory of some of the common modes of AFM operation. We will end with a summary of the some of the exciting new applications of Atomic Force Microscopy.

Bio

Dr. Raman is an Associate Professor in Mechanical Engineering at Purdue University. His research focuses on the nonlinear mechanics and vibrations of microcantilevers, micromechanical resonators, and nanoelectromechanical systems for applications in sensing, RF devices, and atomic force microscopy. Professor Raman is the recipient of the NSF CAREER award (2002), the Purdue Teaching for Tomorrow award, and the Discovery in Mechanical Engineering Award. He serves as an office bearer on the newly formed ASME Technical Committee on Micro- and Nanosystems. He has co-authored 35 journal articles, and currently supervises 9 doctoral students. He is affiliated with the Birck Nanotechnology Canter at Purdue University.

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Researchers should cite this work as follows:

  • Arvind Raman (2005), "Atomic Force Microscopy," http://nanohub.org/resources/520.

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239 MSEE

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