Atomic Force Microscopy

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Atomic Force Microscopy is has become an indispensible tool in nanoscience for the fabrication, metrology, manipulation and property characterization of nanostructures. In this tutorial, we will review the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the oscillating tip, and the basic theory of some of the common modes of AFM operation. We will end with a summary of the some of the exciting new applications of Atomic Force Microscopy.


Dr. Raman is an Associate Professor in Mechanical Engineering at Purdue University. His research focuses on the nonlinear mechanics and vibrations of microcantilevers, micromechanical resonators, and nanoelectromechanical systems for applications in sensing, RF devices, and atomic force microscopy. Professor Raman is the recipient of the NSF CAREER award (2002), the Purdue Teaching for Tomorrow award, and the Discovery in Mechanical Engineering Award. He serves as an office bearer on the newly formed ASME Technical Committee on Micro- and Nanosystems. He has co-authored 35 journal articles, and currently supervises 9 doctoral students. He is affiliated with the Birck Nanotechnology Canter at Purdue University.

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Researchers should cite this work as follows:

  • Arvind Raman (2005), "Atomic Force Microscopy,"

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239 MSEE


  1. carbon nanotubes
  2. carbon nanotubes
  3. circuits
  4. circuits
  5. devices
  6. devices
  7. education/outreach
  8. education/outreach
  9. general tools
  10. general tools
  11. molecular electronics
  12. molecular electronics
  13. nano electro-mechanical systems
  14. nano electro-mechanical systems
  15. quantum dots
  16. quantum dots
  17. spintronics
  18. spintronics
  19. tutorial
  20. tutorial
  21. atomic force microscopy
  22. nano/bio
  23. nano/bio
  24. materials science
  25. materials science