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Home › Online Presentations › Modern X-ray Scattering Methods for Nanoscale Materials Analysis › Supporting Docs

Modern X-ray Scattering Methods for Nanoscale Materials Analysis

By Richard J. Matyi

SUNY - University at Albany, Albany, NY

View Presentation (SWF)

Additional materials available (4)

Supporting Docs

(SWF)Presentation (with audio)
(PDF, 3.00 MB)Presentation Paper
(MP4, 58.66 MB)Podcast (video)
(MP3, 35.89 MB)Podcast (audio)