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Purdue University

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Category	Online Presentations
Abstract	Outline: 1) Sources of variability, 2) Random dopantfluctuations (RDF), 3) Line edge roughness (LER), 4) Impact on design.
Cite this work	Researchers should cite this work as follows: Mark Lundstrom (2008), "ECE 612 Lecture 19: Device Variability," http://nanohub.org/resources/5856. BibTex \| EndNote
Time	10:30 AM, November 06, 2008
Location	EE 117, Purdue University, West Lafayette, IN
Tags	course lecture nanoelectronics nanotransistors transistors