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ECE 612 Lecture 19: Device Variability

By Mark Lundstrom

Purdue University

Published on


Outline: 1) Sources of variability, 2) Random dopantfluctuations (RDF), 3) Line edge roughness (LER), 4) Impact on design.

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Researchers should cite this work as follows:

  • Mark Lundstrom (2008), "ECE 612 Lecture 19: Device Variability,"

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EE 117, Purdue University, West Lafayette, IN

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