ECE 612 Lecture 19: Device Variability

By Mark Lundstrom

Purdue University

Published on

Abstract

Outline: 1) Sources of variability, 2) Random dopantfluctuations (RDF), 3) Line edge roughness (LER), 4) Impact on design.

Cite this work

Researchers should cite this work as follows:

  • Mark Lundstrom (2008), "ECE 612 Lecture 19: Device Variability," http://nanohub.org/resources/5856.

    BibTex | EndNote

Time

Location

EE 117, Purdue University, West Lafayette, IN

Tags