ECE 612 Lecture 19: Device Variability
Category
Published on
Abstract
Outline:
1) Sources of variability,
2) Random dopantfluctuations (RDF),
3) Line edge roughness (LER),
4) Impact on design.
Cite this work
Researchers should cite this work as follows:
-
Mark Lundstrom (2008), "ECE 612 Lecture 19: Device Variability," https://nanohub.org/resources/5856.
Time
Location
EE 117, Purdue University, West Lafayette, IN