Support

Support Options

Submit a Support Ticket

 
You are here: Home › Resources › Online Presentations › ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET › About
This resource has a 9.1 Ranking

Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

Usage Stats
Total: updated 01 Dec, 2011
Users: 1033
Reviews & Citations
Google/IEEE
Avg. Review: 0.0 out of 5 stars
Citations: 0

0 review(s) (Review this)

ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET

By Muhammad Alam

Purdue University

View Presentation (SWF)

Recommendations

No results found.

Powered by ...

Category Online Presentations
Abstract Guest lecturer: Muhammad A. Alam.
Cite this work

Researchers should cite this work as follows:

  • Muhammad A. Alam (2008), "ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET," http://nanohub.org/resources/5861.

    BibTex | EndNote

Time 10:30 AM, November 11, 2008
Location EE 117, Purdue University, West Lafayette, IN
Tags
  1. course lecture
  2. device physics
  3. devices
  4. nanoelectronics
  5. nanotransistors
  6. reliability
  7. transistors

Get Help

Get Involved

Legal

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies.