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Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown

By Muhammad Alam

Purdue University

View Presentation (SWF)

Category Online Presentations
Cite this work

Researchers should cite this work as follows:

  • Muhammad A. Alam (2010), "Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown," http://nanohub.org/resources/7176.

    BibTex | EndNote

Time 10:30 AM, July 23, 2009
Location Beering Hall, Room 2280, Purdue University, West Lafayette, IN
Tags
  1. bottom up approach
  2. course lecture
  3. device physics
  4. devices
  5. iTunes U
  6. nanoelectronics
  7. reliability

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