Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown

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Cite this work

Researchers should cite this work as follows:

  • Muhammad A. Alam (2010), "Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown," http://nanohub.org/resources/7176.

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Time

Location

Beering Hall, Room 2280, Purdue University, West Lafayette, IN

Tags

  1. nanoelectronics
  2. course lecture
  3. bottom up approach
  4. reliability
  5. devices
  6. device physics
  7. iTunes U