Support

Support Options

Submit a Support Ticket

 
Home › Resources › Online Presentations › Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown › About
This resource has a 7.5 Ranking

Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

Usage Stats
Total: updated 03 May 2013
Users: 498
Reviews & Citations
Google/IEEE: updated 22 Apr 2010
Avg. Review: 0.0 out of 5 stars
Citations: 3

0 review(s) (Review this)

Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown

By Muhammad A. Alam

Purdue University

View Presentation (SWF)

Category

Online Presentations

Published on

Cite this work

Researchers should cite this work as follows:

  • Muhammad A. Alam (2010), "Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown," https://nanohub.org/resources/7176.

Time

Location

Beering Hall, Room 2280, Purdue University, West Lafayette, IN

Tags

  1. bottom up approach
  2. course lecture
  3. device physics
  4. devices
  5. iTunes U
  6. nanoelectronics
  7. reliability

Get Help

Get Involved

Legal

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies.