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Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown

By Muhammad A. Alam

Purdue University

Category

Online Presentations

Published on

Cite this work

Researchers should cite this work as follows:

  • Muhammad A. Alam (2010), "Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown," https://nanohub.org/resources/7176.

Time

Location

Beering Hall, Room 2280, Purdue University, West Lafayette, IN

Tags

  1. bottom up approach
  2. course lecture
  3. device physics
  4. devices
  5. iTunes U
  6. nanoelectronics
  7. reliability

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