• Background information
• NBTI interpreted by R-D model
• The act of measurement and observed quantity
• NBTI vs. Light-induced Degradation
• Possibility of Degradation-free Transistors
• Conclusions

Researchers should cite this work as follows:

• Muhammad A. Alam (2010), "Lecture 10: Interface Damage & Negative Bias Temperature Instability," https://nanohub.org/resources/7178.

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1. bottom up approach
2. course lecture
3. device physics
4. devices
5. iTunes U
6. nanoelectronics
7. reliability