Support

Support Options

Submit a Support Ticket

 

Measurements of Interface Trap Density in MOS Capacitors Using AC Conductance Method

By Benafsha Shahlori

Purdue University

Reviews

Write a review

No reviews found. Be the first to review this resource!

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.