Support

Support Options

Submit a Support Ticket

 

Illinois ME 498 Introduction of Nano Science and Technology, Lecture 19: In Touch With Atoms

By Nick Fang1, Omar N Sobh2

1. Massachusetts Institute of Technology (MIT) 2. University of Illinois at Urbana-Champaign

View Presentation (SWF)

Licensed according to this deed.

Published on

Abstract

In touch with Atoms

Topics:

  • Imaging With Energy Beams
  • Energy Beam - Material Interactions
  • Imaging Modes
  • Addition Imaging Features
  • Examples of FIB Technology
  • Three Modes of FIB
  • Radiation Damage of FIB
  • Impact of GA Doping
  • The Scanning Probe System
  • Scanning Tunneling Microscopy
  • STM Components
  • Tunneling Current
  • Two Modes of Forming STM Images
  • Nanofabrication by STM
  • Tunable Bond Formation by STM
  • STM Manipulation
  • Scanning Probe System

Cite this work

Researchers should cite this work as follows:

  • Nick Fang; Omar N Sobh (2009), "Illinois ME 498 Introduction of Nano Science and Technology, Lecture 19: In Touch With Atoms," http://nanohub.org/resources/7969.

    BibTex | EndNote

Tags

No classroom usage data was found. You may need to enable JavaScript to view this data.

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.