Illinois ME 498 Introduction of Nano Science and Technology, Lecture 19: In Touch With Atoms

By Nick Fang1, Omar N Sobh2

1. Massachusetts Institute of Technology (MIT) 2. University of Illinois at Urbana-Champaign

Published on

Abstract

In touch with Atoms

Topics:

  • Imaging With Energy Beams
  • Energy Beam - Material Interactions
  • Imaging Modes
  • Addition Imaging Features
  • Examples of FIB Technology
  • Three Modes of FIB
  • Radiation Damage of FIB
  • Impact of GA Doping
  • The Scanning Probe System
  • Scanning Tunneling Microscopy
  • STM Components
  • Tunneling Current
  • Two Modes of Forming STM Images
  • Nanofabrication by STM
  • Tunable Bond Formation by STM
  • STM Manipulation
  • Scanning Probe System

Cite this work

Researchers should cite this work as follows:

  • Nick Fang; Omar N Sobh (2009), "Illinois ME 498 Introduction of Nano Science and Technology, Lecture 19: In Touch With Atoms," http://nanohub.org/resources/7969.

    BibTex | EndNote

Tags