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This test verifies the Carrier Statistics Tool by comparing the numerically computed and analytically extracted, electron and hole carrier densities. The results are close within 2% of margin.
Researchers should cite this work as follows:
Saumitra Raj Mehrotra; Dragica Vasileska; Gerhard Klimeck (2010), "Carrier Statistics Tool Verification," https://nanohub.org/resources/9489.