High Accuracy Atomic Force Microscope with Self-Optimizing Scan Control
19 Sep 2016 | Online Presentations | Contributor(s): Ryan (Young-kook) Yoo
Atomic force microscope (AFM) is a very useful instrument in characterizing nanoscale features, However, the original AFM design, based on piezo-tube scanner, had slow response and non-orthogonal behavior, inadequate to address the metrology needs of industrial applications: accuracy,...
[Illinois] AFM indentation tests reveal the poroelastic nature of the cytoplasm
19 Nov 2015 | Online Presentations | Contributor(s): Emad Moeendarbary
MATLAB-based blind tip reconstruction algorithms
01 Aug 2014 | Downloads | Contributor(s): Erin Flater, Charles Clifford
We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation", Journal of...
Near-field radiative heat transfer and Casimir Force Measurement
30 May 2012 | Online Presentations | Contributor(s): Joel Chevrier
This presentation first makes a simple introduction on how the charge fluctuations give rises to these effects that are nowadays most effectively detected using MEMS or AFM technologies. This will lead to question the relevance of these effects in the use of MEMS. After description of our...
Nanoscale Spectroscopy and Plasmonics in Infrared
19 Apr 2012 | Online Presentations | Contributor(s): Mikhail Belkin
In this talk, I will present the results of two of our research projects. I will start with a simple technique for nanoscale mid-infrared spectroscopy that we have developed recently. Subwavelength resolution is achieved by detecting optical absorption through measuring local photothermal...
BNC Annual Research Review: Recent advances in dynamic Atomic Force Microscopy Research at Birck
02 Dec 2009 | Online Presentations | Contributor(s): Arvind Raman