You must login before you can run this tool.
Modeling Interface-defect Generation (MIG)
Analyzes device reliability based on NBTI
Citations Non-affiliated (1) | Affiliated (2)
Non-affiliated authors
- H. Hussin, N. Soin, NM Karim, SF Muhamad Hatta, (2011), "On The Effects Of NBTI Degradation In P-MOSFET Devices", Physica B: Condensed Matter, Elsevier, 407, 15: pg: -, (DOI: 10.1016/j.physb.2011.09.048)
Affiliated authors
- M. Alam, K. Roy, Charles Augustine, (2011), "Reliability-and Process-variation Aware Design Of Integrated Circuits-A Broader Perspective", Reliability Physics Symposium \IRPS), 2011 IEEE International , Reliability Physics Symposium \IRPS), 2011 IEEE International, : pg: -, IEEE, 978-1-4244-9113-1 (DOI: 10.1109/IRPS.2011.5784500 )
- M. Alam, K. Kang, B. Paul, K. Roy, (2007), "Reliability- and Process-Variation Aware Design of VLSI Circuits", Physical And Failure Analysis Of Integrated Circuits, 2007, IPFA 2007, 14th International Symposium On The, Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the, : pg: 17-25, IEEE, 07, 978-1-4244-1015-6, (DOI: 10.1109/IPFA.2007.4378050)