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Citations Non-affiliated (1) | Affiliated (2)
- H. Hussin, N. Soin, NM Karim, SF Muhamad Hatta, (2011), "On The Effects Of NBTI Degradation In P-MOSFET Devices", Physica B: Condensed Matter, Elsevier, 407, 15: pg: -, (DOI: 10.1016/j.physb.2011.09.048)
- Muhammad Alam, K. Roy, Charles Augustine, (2011), "Reliability-and Process-variation Aware Design Of Integrated Circuits-A Broader Perspective", Reliability Physics Symposium \IRPS), 2011 IEEE International , Reliability Physics Symposium \IRPS), 2011 IEEE International, : pg: -, IEEE, 978-1-4244-9113-1 (DOI: 10.1109/IRPS.2011.5784500 )
- Muhammad Alam, K. Kang, B. Paul, K. Roy, (2007), "Reliability- and Process-Variation Aware Design of VLSI Circuits", Physical And Failure Analysis Of Integrated Circuits, 2007, IPFA 2007, 14th International Symposium On The, Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the, : pg: 17-25, IEEE, 07, 978-1-4244-1015-6, (DOI: 10.1109/IPFA.2007.4378050)