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Citations Non-affiliated (1) | Affiliated (2)
H. Hussin; N. Soin; NM Karim; SF Muhamad Hatta (2011), "On The Effects Of NBTI Degradation In P-MOSFET Devices," Physica B: Condensed Matter, Elsevier, 407, 15: pg. -. (DOI: 10.1016/j.physb.2011.09.048).
Muhammad Alam; K. Roy; Charles Augustine (2011), "Reliability-and Process-variation Aware Design Of Integrated Circuits-A Broader Perspective," Reliability Physics Symposium IRPS), 2011 IEEE International : pg. -, IEEE. 978-1-4244-9113-1 . (DOI: 10.1109/IRPS.2011.5784500 ).
Muhammad Alam; K. Kang; B. Paul; K. Roy (2007), "Reliability- and Process-Variation Aware Design of VLSI Circuits," Physical And Failure Analysis Of Integrated Circuits, 2007, IPFA 2007, 14th International Symposium On The: pg. 17-25, IEEE, 07. 978-1-4244-1015-6. (DOI: 10.1109/IPFA.2007.4378050).