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Modeling Interface-defect Generation (MIG)

Analyzes device reliability based on NBTI

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Version 2.0 - published on 08 Mar 2010

doi:10254/nanohub-r1647.4 cite this

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399 inconsistent exponent
Asked by Ming-Yi Lee @ 10:52 AM on 11 Nov 2009 • Closed • 1 		0 Like

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