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Total: updated 02 Jan, 2012
Users: 356
Jobs: 2692
Avg. exec. time: 30 secs
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Avg. Review: 4.0 out of 5 stars
Citations: 3
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364 user(s), detailed usage

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Modeling Interface-defect Generation (MIG)

Analyzes device reliability based on NBTI

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Version 2.0 - published on 08 Mar 2010

doi:10254/nanohub-r1647.4 cite this

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  1. 4.0 out of 5 stars

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