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This resource has a 9.4 Ranking

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Usage Stats
Total: updated 26 May 2013
Users: 417
Jobs: 3669
Avg. exec. time: 28 secs
Reviews & Citations
Google/IEEE: updated 22 Apr 2010
Avg. Review: 4.0 out of 5 stars
Citations: 3
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417 users, detailed usage

18 users in 7 classes

3 Citation(s)

2 questions (Ask a question)

1 review(s) (Review this)

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Modeling Interface-defect Generation (MIG)

Analyzes device reliability based on NBTI

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Version 2.0 - published on 08 Mar 2010

doi:10.4231/D30G3GX8V cite this

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  1. Anonymous

    4.0 out of 5 stars

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