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Home › Resources › Tools › Modeling Interface-defect Generation (MIG) › Usage
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Usage Stats
Total: updated 02 Jan, 2012
Users: 356
Jobs: 2692
Avg. exec. time: 30 secs
Reviews & Citations
Google/IEEE
Avg. Review: 4.0 out of 5 stars
Citations: 3
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364 user(s), detailed usage

11 users in 4 class(es)

3 Citation(s)

1 question (Ask a question)

1 review(s) (Review this)

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Modeling Interface-defect Generation (MIG)

Analyzes device reliability based on NBTI

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Version 2.0 - published on 08 Mar 2010

doi:10254/nanohub-r1647.4 cite this

This tool is closed source.

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Usage

Table 1: Overview
Item Average Total
Simulation Users: - 364
Interactive Sessions: - 1,174
Simulation Sessions: - 1,623
Simulation Runs: - 2,795
Wall Clock Time: 3.28 hours 221.5 days
CPU time: 29.66 seconds 13.37 hours
Interaction Time: 1.61 hours 109 days

Table 2: Users By Organization Type
# Type Users Percent
1 Educational - University 266 73.08
2 Industry 51 14.01
3 Unidentified 43 11.81
4 National Lab 9 2.47
5 Unemployed 4 1.1
6 Educational - Pre-College 3 0.82
Total Users 364 100
Table 3: Users by Country of Residence
# Country Users Percent
1 UNITED STATES 141 38.74
2 INDIA 43 11.81
3 TAIWAN 18 4.95
4 CHINA 14 3.85
5 KOREA, REPUBLIC OF 12 3.3
6 SINGAPORE 11 3.02
7 BANGLADESH 9 2.47
8 FRANCE 7 1.92
9 MALAYSIA 6 1.65
10 CANADA 6 1.65
Total Users 364 100
Table 4: Top Domains by User Count
# Domains Users Percent
1 Unidentified 132 36.26
2 purdue.edu 63 17.31
3 comcast.net 18 4.95
4 vsnl.net.in 10 2.75
5 verizon.net 9 2.47
6 rcac.purdue.edu 6 1.65
7 nctu.edu.tw 6 1.65
8 ibm.com 6 1.65
9 airtelbroadband.in 6 1.65
10 hinet.net 6 1.65
Total Users 364 100

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