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By Ahmad Ehteshamul Islam1, HALDUN KUFLUOGLU1, Muhammad Alam1
1. Purdue University
Analyzes device reliability based on NBTI
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Version 2.1 - published on 22 Jan 2014
doi:10.4231/D3FQ9Q555 cite this
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Location of all "Modeling Interface-defect Generation (MIG)" Users Since Its Posting