Modeling Interface-defect Generation (MIG)

Analyzes device reliability based on NBTI

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Version 2.1 - published on 22 Jan 2014

doi:10.4231/D3FQ9Q555 cite this

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Usage

World usage

Location of all "Modeling Interface-defect Generation (MIG)" Users Since Its Posting

Simulation Users

586

3 4 15 26 39 52 56 64 73 84 92 102 112 116 123 135 145 152 153 157 162 167 173 178 181 183 189 193 195 201 203 208 214 216 219 220 222 245 247 251 253 258 264 267 275 276 279 284 286 291 293 294 296 301 304 306 314 317 319 321 324 328 328 332 335 355 356 358 361 362 365 370 370 372 373 374 379 382 386 387 399 401 407 417 420 473 474 474 476 476 479 481 481 481 486 494 494 494 496 499 503 507 508 513 516 532 539 545 546 547 547 555 557 558 560 561 565 566 566 567 568 586 586

Users By Organization Type
Type Users
Educational - University 366 (61.93%)
Unidentified 146 (24.7%)
Industry 58 (9.81%)
National Lab 10 (1.69%)
Unemployed 5 (0.85%)
Educational - Pre-College 3 (0.51%)
Government Agency 2 (0.34%)
Military 1 (0.17%)
Users by Country of Residence
Country Users
us UNITED STATES 192 (53.48%)
in INDIA 55 (15.32%)
cn CHINA 18 (5.01%)
tw TAIWAN 18 (5.01%)
kr KOREA, REPUBLIC OF 17 (4.74%)
jp JAPAN 16 (4.46%)
bd BANGLADESH 11 (3.06%)
sg SINGAPORE 11 (3.06%)
my MALAYSIA 11 (3.06%)
dz ALGERIA 10 (2.79%)

Simulation Runs

8,226

26 69 152 180 242 289 313 339 365 394 420 442 463 474 496 544 565 591 594 613 628 640 693 741 746 751 762 775 790 797 806 816 836 884 929 979 997 1141 1157 1176 1186 1251 1283 1306 1374 1391 1406 1425 1468 1476 1479 1487 1496 1517 1522 1525 1662 1875 1927 2007 2078 2196 2253 2478 2508 2665 2692 2730 2755 2764 2797 2808 2824 2905 2908 2911 2954 3028 3039 3156 3411 3487 3643 3669 3699 4620 4624 4649 4664 4695 4757 4779 4779 4782 4855 4900 4900 4958 4965 4978 5037 5174 5250 5274 5385 6163 6872 7191 7542 7550 7552 7572 7599 7629 7641 7643 7712 7793 7821 7874 7992 8226 8226
Overview
Average Total
Wall Clock Time 1.86 hours 451.49 days
CPU time 16.79 seconds 1.13 days
Interaction Time 37.81 minutes 153.04 days