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Micro-Mechanics Simulation Tool: Thin film

This tool simulates a threading dislocation evolving in a passivated thin film

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Version 1.0.3 - published on 19 Jun 2014

doi:10.4231/D30P0WR6J cite this

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Crystalline films grown epitaxially on substrates consisting of a different crystalline material are of considerable interest in optoelectronic devices and the semiconductor industry. The film and substrate have in general different lattice parameters. This lattice mismatch affects the quality of interfaces and can lead to very high densities of misfit dislocations. Here we study the strengthening of a thin film on a substrate. In particular we consider the motion of a dislocations gliding on its slip plane within the film and their interaction with the substrate.

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Marisol Koslowski's group in Mechanical Engineering Purdue University

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This work was sponsored by NSF's NCN. The underlying dislocation dynamics code was developed with support from the US Department of Energy, Office of Basic Energy Sciences under contract DEFG-02-07ER47398


1. Scaling laws in plastic deformation, M. Koslowski, Philosophical Magazine, 87(8-9), 2007. 2. A phase-field theory of dislocation dynamics, strain hardening and hysteresis in ductile single crystals. M. Koslowski, A.M. Cuitino and M. Ortiz , Journal of the Mechanics and Physics of Solids, 50(12), 2002.

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Researchers should cite this work as follows:

  • Sowmya Ramarapu; Soumava Bera; Andrew Robison; Marisol Koslowski; Lei Lei; Nikolaus Utomo; Efosa Ogiesoba; Yuesong Xie; Ruixuan Ren (2014), "Micro-Mechanics Simulation Tool: Thin film," (DOI: 10.4231/D30P0WR6J).

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