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By Sowmya Ramarapu1, Soumava Bera1, Lei Cao1, Marisol Koslowski1, Lei Lei1, Efosa Ogiesoba1, Andrew Robison, Ruixuan Ren1, Nikolaus Utomo1, Yuesong Xie1
1. Purdue University
This tool simulates a threading dislocation evolving in a passivated thin film
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Version 1.1 - published on 08 Aug 2014
doi:10.4231/D3M03XZ0K cite this
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