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Analytic spin precession simulator has been developed by Appelbaum Lab at University of Delaware, Newark, DE.
DARPA/MTO and ONR.
Ian Appelbaum, Biqin Huang, and Douwe J. Monsma, "Electronic measurement and control of spin transport in silicon", Nature 447, 295 (2007).
Jing Li, Biqin Huang, and Ian Appelbaum, "Oblique Hanle Effect in Semiconductor Spin Transport Devices", Appl. Phys. Lett. 92, 142507 (2008).
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Researchers should cite this work as follows:
- Spin polarized transport