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XPS Thickness Solver
Helps the user to determine the thickness of an overlayer material from XPS experiment data.
Version beta 2.0 - published on 10 Jan 2012
doi:10.4231/D35D8ND60 cite this
This tool is closed source.
| Category | Tools |
|---|---|
| Abstract | This tool was developed mainly to provide a quick analysis resource for XPS experiments involving graphene flakes or films of different thicknesses. Given sets of data from the experiment as indicated in the manual for this tool, it can provide the number of monolayers not only for graphene flakes, but other thin film materials. |
| Powered by | Network for Computational Nanotechnology (NCN), Birk Nanotechnology Center, Purdue University. |
| Credits | David Saenz, Dmitry Zemlyanov, Andrey A. Voevodin, Gerhard Klimeck |
| Sponsored by | Purdue Network for Computational Nanotechnology. |
| References | C. S. Fadley. Basic Concepts of X-Ray Photoelectron Spectroscopy, C. J. Powel and A. Jabolonsky. Nist Electron Inelastic Mean Free Path Database, CasaXPS.com |
| Publications | XPS Measurements of Graphene Film Thickness |
| Cite this work | Researchers should cite this work as follows: RAPPTURE, NIST Database #71, CasaXPS. Refer to manual for detailed citations. |
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