Support

Support Options

Submit a Support Ticket

 

XPS Thickness Solver

By Kyle Christopher Smith1, David A Saenz1, Dmitry Zemlyanov1, Andrey A Voevodin2

1. Purdue University 2. Air Force Research Laboratory

Helps the user to determine the thickness of an overlayer material from XPS experiment data.

Launch Tool

You must login before you can run this tool.

Version 3.11 - published on 15 Sep 2014

doi:10.4231/D3FJ29D7X cite this

This tool is closed source.

View All Supporting Documents

Category

Tools

Published on

Abstract

This tool was developed mainly to provide a quick analysis resource for XPS experiments involving graphene flakes or films of different thicknesses. Given sets of data from experimental results, it can provide the number of monolayers not only for graphene flakes, but other thin film materials.

Powered by

Network for Computational Nanotechnology (NCN), Birk Nanotechnology Center, Purdue University.

Credits

Kyle C. Smith, David Saenz, Dmitry Zemlyanov, Andrey A. Voevodin, Gerhard Klimeck

Sponsored by

Purdue Network for Computational Nanotechnology.

References

C. S. Fadley. Basic Concepts of X-Ray Photoelectron Spectroscopy, C. J. Powel and A. Jabolonsky. NIST Electron Inelastic Mean Free Path Database, CasaXPS.com

Publications

XPS Measurements of Graphene Film Thickness, submitted (2012).

Cite this work

Researchers should cite this work as follows:

  • RAPPTURE, NIST Database #71 and #82, CasaXPS.

  • Kyle Christopher Smith; David A Saenz; Dmitry Zemlyanov; Andrey A Voevodin (2011), "XPS Thickness Solver," http://nanohub.org/resources/xpsts. (DOI: 10.4231/D3FJ29D7X).

    BibTex | EndNote

Tags

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.