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This tool was developed mainly to provide a quick analysis resource for XPS experiments involving graphene flakes or films of different thicknesses. Given sets of data from experimental results, it can provide the number of monolayers not only for graphene flakes, but other thin film materials.
Network for Computational Nanotechnology (NCN), Birk Nanotechnology Center, Purdue University.
Kyle C. Smith, David Saenz, Dmitry Zemlyanov, Andrey A. Voevodin, Gerhard Klimeck
Purdue Network for Computational Nanotechnology.
C. S. Fadley. Basic Concepts of X-Ray Photoelectron Spectroscopy, C. J. Powel and A. Jabolonsky. NIST Electron Inelastic Mean Free Path Database, CasaXPS.com
XPS Measurements of Graphene Film Thickness, submitted (2012).
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Researchers should cite this work as follows:
RAPPTURE, NIST Database #71 and #82, CasaXPS.